Metalized elastomeric probe structure

Details Metalized elastomeric probe structure Metalized elastomeric probe structure

2005-09-30

2011-11-08

Velez, Roberto (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S756020

Reexamination Certificate

active

08054095

ABSTRACT:
A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.

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Search Report for EP 05858193 dated Jan. 13, 2010.

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