Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2010-01-26
2011-12-13
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C257SE21295
Reexamination Certificate
active
08076243
ABSTRACT:
Compositions and methods for forming a metal-containing thin film on a substrate. A reactor and at least one substrate in the reactor are provided. A metal-containing bis-β-diketiminate precursor is introduced into the reactor. The reactor is maintained at a set temperature and pressure, and the precursor is contacted with the substrate to form a metal-containing film on the substrate.
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Park, K-H et al. “Remarkably Volatile Copper(II) Complexes ofN,N'-Unsymmetrically Substitutes 1,3-Diketimines as Precursors for Cu Metal Deposition via CVD or ALD”, J. Am. Chem. Soc. 2005 127.
Park, K-H et al. “Nonfluorinated Volatile Copper(I) 1,3-Diketiminates as Precursors for Cu Metal Deposition via Atomic Layer Deposition”, Inorganic Chem. 2006 45(21) pp. 8480-8482.
Dussarrat Christian
Hsiao Cheng-Fang
Lansalot-Matras Clement
Omarjee Vincent M.
American Air Liquide Inc.
Ghyka Alexander
L'Air Liquide Societe Anonyme pour l'Etude et l'Exploitation des
McQueeney Patricia E.
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