Metal oxide semiconductor transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – With lattice constant mismatch

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S218000, C438S285000

Reexamination Certificate

active

07745847

ABSTRACT:
The present invention provides a method for fabricating a metal oxide semiconductor transistor. First, a semiconductor substrate is provided and at least a gate is formed on the semiconductor substrate. A protective layer is then formed on the semiconductor substrate and the gate. Subsequently, at least a recess is formed in the semiconductor substrate adjacent to the gate, and then an epitaxial layer is formed in the recess. A lightly doped region is formed in the semiconductor substrate adjacent to the gate. Finally, a spacer is formed on the sidewall of the gate.

REFERENCES:
patent: 6110787 (2000-08-01), Chan et al.
patent: 6429084 (2002-08-01), Park et al.
patent: 6774000 (2004-08-01), Natzle et al.
patent: 6815770 (2004-11-01), Chien et al.
patent: 7195985 (2007-03-01), Murthy et al.
patent: 2005/0156154 (2005-07-01), Zhu et al.
patent: 2006/0211245 (2006-09-01), Maszara
patent: 2007/0298558 (2007-12-01), Yamauchi et al.
patent: 2008/0006818 (2008-01-01), Luo et al.
patent: 2008/0032468 (2008-02-01), Cheng et al.
patent: 2008/0179636 (2008-07-01), Chidambarrao et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Metal oxide semiconductor transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Metal oxide semiconductor transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metal oxide semiconductor transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4204409

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.