Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – With lattice constant mismatch
Reexamination Certificate
2007-08-09
2010-06-29
Dang, Phuc T (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
With lattice constant mismatch
C438S218000, C438S285000
Reexamination Certificate
active
07745847
ABSTRACT:
The present invention provides a method for fabricating a metal oxide semiconductor transistor. First, a semiconductor substrate is provided and at least a gate is formed on the semiconductor substrate. A protective layer is then formed on the semiconductor substrate and the gate. Subsequently, at least a recess is formed in the semiconductor substrate adjacent to the gate, and then an epitaxial layer is formed in the recess. A lightly doped region is formed in the semiconductor substrate adjacent to the gate. Finally, a spacer is formed on the sidewall of the gate.
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Chen Hsuan-Hsu
Cheng Po-Lun
Hsu Shih-Chieh
Ting Shyh-Fann
Tseng Chu-Yin
Dang Phuc T
Hsu Winston
United Microelectronics Corp.
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