Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-01
2008-07-01
Lewis, Monica (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE27098
Reexamination Certificate
active
07394119
ABSTRACT:
A semiconductor device with a metal oxide semiconductor (MOS) type transistor structure, which is used for, e.g. a static random access memory (SRAM) type memory cell, includes a part that is vulnerable to soft errors. In the semiconductor device with the MOS type transistor structure, an additional load capacitance is formed at the part that is vulnerable to soft errors.
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patent: 4903087 (1990-02-01), Jerome et al.
patent: 6740958 (2004-05-01), Nakazato et al.
patent: 6-310683 (1994-11-01), None
patent: 07086418 (1995-03-01), None
Derwent Abstract for US Patent No. 4,903,087.
ISE TCAD Release 8.0, “ISE Part II Dessis,” vol. 4a, pp. 11.273-11.280, ISE Integrated Systems Engineering, 1995-2002.
DLA Piper (US) LLP
Kabushiki Kaisha Toshiba
Lewis Monica
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