Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate
Reexamination Certificate
2006-04-11
2010-12-28
Louie, Wai-Sing (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having schottky gate
C438S169000, C438S174000, C257SE51009
Reexamination Certificate
active
07858456
ABSTRACT:
Merged P-i-N Schottky device in which the oppositely doped diffusions extend to a depth and have been spaced apart such that the device is capable of absorbing a reverse avalanche energy comparable to a Fast Recovery Epitaxial Diode having a comparatively deeper oppositely doped diffusion region.
REFERENCES:
patent: 6294445 (2001-09-01), Bol et al.
patent: 6524900 (2003-02-01), Dahlqvist et al.
patent: 2004/0061195 (2004-04-01), Okada et al.
patent: 2004/0212011 (2004-10-01), Ryu
patent: 03-024767 (1991-02-01), None
patent: 10-117003 (1998-05-01), None
Andoh Kohji
Chiola Davide
Fimiani Silvestro
Louie Wai-Sing
Siliconix Technology C. V.
LandOfFree
Merged P-i-N Schottky structure does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Merged P-i-N Schottky structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Merged P-i-N Schottky structure will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4217649