Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation
Reexamination Certificate
2011-04-12
2011-04-12
Tran, Minh-Loan T (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Physical deformation
C257S414000, C257S416000, C257S417000, C257S418000, C257S419000, C257S420000, C257SE29324, C257S252000, C257S254000, C438S050000
Reexamination Certificate
active
07923792
ABSTRACT:
An MEMS sensor constructed on a base chip and having a capacitive mode of operation is disclosed. The MEMS sensor has a patterned layer construction applied on the base chip. A cutout is produced in the layer construction, the moveable electrode, for example a membrane, being arranged in said cutout. The cutout is spanned by a covering layer, which bears on the layer construction around the cutout and comprises the back electrode.
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austruamicrosystems AG
Cohen Pontani Lieberman & Pavane LLP
Lopez Fei Fei Yeung
Tran Minh-Loan T
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