Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With window means
Reexamination Certificate
2007-06-04
2008-12-16
Geyer, Scott B (Department: 2812)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
With window means
C257S704000, C257SE23124, C257SE23127
Reexamination Certificate
active
07466018
ABSTRACT:
A method and system in which a semiconductor wafer having a plurality of dies is inspected through a visual inspection and/or an electrical test. If certain of the dies on the wafer pass the inspection, then windows are mounted or affixed above those certain dies while they are still a part of the wafer.
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Knipe Richard L.
Kocian Thomas A.
Strumpell Mark H.
Brady III Wade J.
Geyer Scott B
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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