MEMS device and fabrication method thereof

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S619000

Reexamination Certificate

active

06720201

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a Micro Electro Mechanical System (MEMS) device and a fabrication method thereof. More particularly, the present invention relates to an electrostatic driving MEMS device having a driving electrode in an embedded structure and a fabrication method thereof.
2. Description of the Related Art
Micro Electro Mechanical System is a technology that implements mechanical and electrical parts, using semiconductor processing techniques. A conventional MEMS device generally includes floating driving parts that are movable over a substrate in order for the device fabricated using MEMS technology to perform mechanical operations.
FIG. 1
illustrates a cross-sectional view schematically showing a conventional MEMS device. The conventional MEMS device of
FIG. 1
includes a substrate
10
, a fixing part
30
attached to the substrate
10
, and a driving part
40
extending from the fixing part
30
. The fixing part
30
is generally referred to as an anchor or a support. The fixing part
30
connects the driving part
40
to the substrate
10
.
The driving part
40
is spaced to float over the substrate
10
. The driving part
40
is movable in an upward and downward direction, as shown by the broken lines in FIG.
1
. The movement of the driving part
40
is controlled by a predetermined driving force from an electrode part
20
formed on the substrate
10
. The driving part
40
is typically fabricated in a shape such as a beam, a membrane, or the like depending on device requirements.
FIG. 2A
to
FIG. 2E
illustrate views for sequentially illustrating stages in a process for fabricating a conventional electrostatic drive-type RF MEMS device.
As shown in
FIG. 2A
, a driving electrode layer
220
, for providing an electrostatic driving force, is formed on a substrate
210
through patterning. In
FIG. 2B
, a metal layer is formed on the substrate and then the metal layer is patterned so metal layer areas
230
having similar shapes remain. The metal layer areas
230
are an anchor part to acts as a fixing part fixed on the substrate
210
and an RF line to act as input and/or output terminals of an RF signal. The metal layer areas
230
are formed in a thick layer having a thickness of 2 to 3 &mgr;m in consideration of the skin depth effect.
Next, referring to
FIG. 2C
, an insulation layer
240
is formed to surround the driving electrode layer
220
formed on the substrate
210
.
Thereafter, as shown in
FIG. 2D
, a sacrificial layer
250
is formed on the resultant structure on the substrate
210
. The sacrificial layer
250
over the anchor part fixed on the substrate
210
is etched through predetermined patterning. Referring to
FIG. 2E
, a MEMS structure layer is then formed on the patterned sacrificial layer
250
. The MEMS structure layer includes a driving part
260
and a connection part
261
.
Subsequently, predetermined etching access holes (not shown) are formed in the driving part
260
of the MEMS structure layer, and an etchant is supplied through the etching access holes to selectively etch only the sacrificial layer
250
. Accordingly, as shown in
FIG. 2E
, a conventional MEMS device is fabricated such that the driving part
260
floats over the substrate
210
after the removal of the sacrificial layer
250
.
As stated above, a conventional fabrication process proceeds regardless of a step-height difference between the metal layer areas
230
and the driving electrode layer
220
. Consequently, a step-height difference between the metal layer areas
230
and the driving electrode layer
220
causes the driving part
260
, which is formed by a subsequent procedure, to be formed unevenly, as may be seen in FIG.
2
E. Thus, the reliability of such a MEMS device decreases. Moreover, since unevenness of the driving part is not expected during the designing of the device, a significant error exists between the design of the device and the fabrication process. Further, unevenness in the driving part
260
causes a problem in that the driving of the driving part
260
may be incomplete when the MEMS device is driven.
Further, in the stages of the fabrication process shown in
FIGS. 2D and 2E
, the connection part
261
of the MEMS structure layer, which is formed on an anchor part and the substrate
210
, is formed in a bent shape that is relatively thinner than the anchor part and the MEMS structure layer.
Accordingly, the connection part
261
having a thin and bent shape causes a problem in the stability of the MEMS device, since the general operation of the MEMS device involves the movement of the MEMS structure, i.e., the driving part
260
.
SUMMARY OF THE INVENTION
In an effort to solve the above problems, it is a feature of an embodiment of the present invention to provide a MEMS device having enhanced reliability and a stable driving capability and a fabrication method thereof.
The above feature of the present invention is provided by a first embodiment wherein a method for fabricating a MEMS device having a fixing part fixed to a substrate, a driving part connected to the fixing part by a connecting part, wherein the driving part is floating over the substrate, a driving electrode for driving the driving part by a predetermined driving force, and contact parts selectively switchable with the driving part, including patterning the driving electrode on the substrate; forming an insulation layer on the substrate on which the driving electrode is formed; patterning the insulation layer and etching a fixing region and a contact region of the insulation layer, in which the fixing part and the contact parts, respectively, are to be formed; forming a metal layer over the substrate including the fixing and contact regions; planarizing the metal layer until the insulation layer is exposed; forming a sacrificial layer on the substrate; patterning the sacrificial layer to form an opening exposing a portion of the insulation layer and the metal layer in the fixing region; forming a MEMS structure layer on the sacrificial layer to partially fill the opening, thereby forming sidewalls therein, wherein the MEMS structure layer forms the fixing part, the driving part and the connection part connecting the fixing part and the driving part on the sacrificial layer; and selectively removing a portion of the sacrificial layer by etching so that a portion of the sacrificial layer remains in the fixing region.
Preferably, the insulation layer is formed as a thick film having a thickness at least as thick as the thickness of the driving electrode so that the driving electrode is embedded in the insulation layer.
Preferably, in the step for forming the opening, the opening is substantially formed over the entire portion remaining except for the portion matched with a connection part connecting the fixing part and the driving part. A width of the connection part is preferably narrower than that of the fixing part.
Before the selective removal of the sacrificial layer, the method preferably further includes forming etching access holes in the MEMS structure layer. Preferably, the etching access holes are formed in the driving part of the MEMS structure layer.
Preferably, the insulation layer is a TetraEthyl OrthoSilicate (TEOS) oxide film. The metal layer is preferably gold. The planarization is preferably performed by polishing. The sacrificial layer is preferably a material selected from the group consisting of aluminum, copper, oxide, and nickel.
The above feature of the present invention may also be provided by a second embodiment wherein a method for fabricating a MEMS device having a fixing part fixed to a substrate, a driving part connected to the fixing part by a connecting part, wherein the driving part is floating over the substrate, a driving electrode for driving the driving part by a predetermined driving force, and contact parts selectively switchable with the driving part, including patterning the driving electrode on the substrate; forming a first insulation layer on the substrate on which t

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

MEMS device and fabrication method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with MEMS device and fabrication method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and MEMS device and fabrication method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3233968

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.