Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2007-09-18
2007-09-18
Mai, Son L. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S211000
Reexamination Certificate
active
11386048
ABSTRACT:
Methods and apparatus for determining a temperature of a memory device. A memory device includes a memory array, a temperature configured to measure a temperature of the device and an evaluating circuit configured to receive a signal representative of the temperature measured by the temperature sensor and configured to generate a code word indicative of the measured temperature and a type of the temperature sensor, the temperature sensor being selected from one of at least two different temperature sensor types.
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Braun Georg
Egerer Jens Christoph
Infineon - Technologies AG
Mai Son L.
Patterson & Sheridan L.L.P.
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