Memory tester has memory sets configurable for use as error...

Details Memory tester has memory sets configurable for use as error... Memory tester has memory sets configurable for use as error...

2005-02-01

2005-02-01

Chase, Shelly A (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

06851076

ABSTRACT:
The various functions that are desirable for interior test memory within a memory tester are implemented in Memory Sets each serving as the host for one or sometimes more of such functions. For certain classes of testing a portion of interior test memory can be used as a Stimulus Log RAM that operates as an ideal DUT to create the correct conditions that are to exist in an actual DUT after testing. The actual part can then be tested, while the expected receive vectors are taken from the Stimulus Log RAM, and the comparison results sent to an ECR, Tag RAM's, etc., as usual. In this way the test program does not have to create or contain within itself the particular receive vectors that are the expected response from the applied stimulus.

REFERENCES:
patent: 5422892 (1995-06-01), Hii et al.
patent: 6055661 (2000-04-01), Luk

Affiliated with

Also associated with

Rating

Memory tester has memory sets configurable for use as error... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory tester has memory sets configurable for use as error..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory tester has memory sets configurable for use as error... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3479079