Memory-row selector having a test function

Details Memory-row selector having a test function Memory-row selector having a test function

1997-09-10

1998-12-08

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

36523006, 371 211, 371 214, G11C 700

Patent

active

058480188

ABSTRACT:
A memory-row selector includes an address input terminal, a mode terminal, and even-row-select and odd-row-select terminals. While a test signal level occupies the mode terminal (ie., during a test mode), the selector places either an active level or an inactive level on both of the even-row-select and odd-row-select terminals. An active level on both of the select terminals enables both even-row and odd-row word lines, and allows writing to or reading from memory cells in both odd and even rows. An inactive level on both of the select terminals disables both even-row and odd-row word lines, including the word line coupled to the addressed memory cell.

REFERENCES:
patent: 4425633 (1984-01-01), Swain
patent: 4644196 (1987-02-01), Flannagan
patent: 4807191 (1989-02-01), Flannagan
patent: 4835458 (1989-05-01), Kim
patent: 4962324 (1990-10-01), Park
patent: 5072138 (1991-12-01), Slemmer et al.
patent: 5126970 (1992-06-01), Ul Haq
patent: 5161159 (1992-11-01), McClure et al.
patent: 5185722 (1993-02-01), Ota et al.
patent: 5208778 (1993-05-01), Kumanoya et al.
patent: 5265100 (1993-11-01), McClure et al.
patent: 5267210 (1993-11-01), McClure et al.
patent: 5305268 (1994-04-01), McClure
patent: 5311467 (1994-05-01), Lysinger et al.
patent: 5311473 (1994-05-01), McClure et al.
patent: 5338277 (1994-08-01), McClure
patent: 5341336 (1994-08-01), McClure
patent: 5349243 (1994-09-01), MClure
patent: 5357468 (1994-10-01), Satani et al.
patent: 5396108 (1995-03-01), McClure
patent: 5404334 (1995-04-01), Pascucci et al.
patent: 5408435 (1995-04-01), McClure et al.
patent: 5424985 (1995-06-01), McClure et al.
patent: 5428621 (1995-06-01), Mehrotra et al.
patent: 5440516 (1995-08-01), Slemmer
patent: 5444662 (1995-08-01), Tanaka et al.
patent: 5450019 (1995-09-01), McClure et al.
patent: 5455798 (1995-10-01), McClure
patent: 5455802 (1995-10-01), McClure
patent: 5473567 (1995-12-01), McClure
patent: 5485430 (1996-01-01), McClure
patent: 5493532 (1996-02-01), McClure
patent: 5502678 (1996-03-01), McClure
patent: 5523977 (1996-06-01), Tobita et al.
patent: 5535163 (1996-07-01), Matsui
patent: 5546537 (1996-08-01), McClure
patent: 5553025 (1996-09-01), Haraguchi
patent: 5559744 (1996-09-01), Kuriyama et al.
patent: 5577051 (1996-11-01), McClure
patent: 5583816 (1996-12-01), McClure

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