Memory row and column redundancy

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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C365S230030, C365S201000, C365S225700

Reexamination Certificate

active

07738308

ABSTRACT:
In one embodiment, a memory includes a row and/or column redundancy architecture that uses binary cells to indicate whether a given row or column of memory cells is faulty. The binary cell is adapted to store a “repair true” signal in response to a conventional access to the corresponding row or column and also the assertion of a set signal.

REFERENCES:
patent: 5388076 (1995-02-01), Ihara
patent: 5469390 (1995-11-01), Sasaki et al.
patent: 5848009 (1998-12-01), Lee et al.
patent: 5959906 (1999-09-01), Song et al.
patent: 6678195 (2004-01-01), Hidaka
patent: 7349253 (2008-03-01), Perner et al.
patent: 2003/0103394 (2003-06-01), Koshikawa
patent: 2006/0052247 (2006-03-01), Beaudegnies
PCT Search Report for PCT/US06/32222, publication date May 21, 2007, 7 pages attached.

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