Memory repair circuit and method

Details Memory repair circuit and method Memory repair circuit and method

2007-08-14

2007-08-14

Maskulinski, Michael (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S710000, C714S711000

Reexamination Certificate

active

10868208

ABSTRACT:
A self-repair circuit for a semiconductor memory provides input and output test selectors coupled to respective data bit group inputs and outputs, respectively and input and output repair selectors coupled between the input and output test selectors and functional inputs and functional outputs, respectively. This arrangement allows all data bit groups to be tested in one pass and all test and repair selector circuitry to be tested.

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