Memory reading method for resistance drift mitigation

Static information storage and retrieval – Systems using particular element – Amorphous

Reexamination Certificate

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C365S148000

Reexamination Certificate

active

07929338

ABSTRACT:
Techniques for reading phase change memory that mitigate resistance drift. One contemplated method includes apply a plurality of electrical input signals to the memory cell. The method includes measuring a plurality of electrical output signals from the memory cell resulting from the plurality of electrical input signals. The method includes calculating an invariant component of the plurality of electrical output signals dependent on the configuration of amorphous material in the memory cell. The method also includes determining a memory state of the memory cell based on the invariant component. In one embodiment of the invention, the method further includes mapping the plurality of electrical output signals to a measurements region of a plurality of measurements regions. The measurements regions correspond to memory states of the memory cell.

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Gille, T.; Lisoni, J.; Goux, L.; De Meyer, K.; Wouters, D.J.; “Modeling of the mechanical behavior during programming of a non-volatile phase-change memory cell using a coupled electrical-thermal-mechanical finite-element simulator” Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on Apr. 16-18, 2007 pp. 1-6.
Karpov, I.; Mitra, M.; Kau, D.; Spadini, G.; Kryukov, Y.A.; Karpov, V.; “Temporal Changes of Parameters in Phase Change Memory” VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on Apr. 21-23, 2008 pp. 140-141.

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