Memory module with test structure

Details Memory module with test structure Memory module with test structure

2008-09-23

2008-09-23

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C365S201000

Reexamination Certificate

active

10452482

ABSTRACT:
A memory module has a memory cell configuration. For the purpose of testing the memory cell configuration, the memory module has a test structure with at least two test circuits, which are disposed in a distributed fashion on the memory module and are connected to one another via a common test switching bus, which can be connected to an address bus of the memory module via a decoupling circuit during a test operation.

REFERENCES:
patent: 4481627 (1984-11-01), Beauchesne et al.
patent: 4860290 (1989-08-01), Daniels et al.
patent: 5054024 (1991-10-01), Whetsel
patent: 5173904 (1992-12-01), Daniels et al.
patent: 5617531 (1997-04-01), Crouch et al.
patent: 5712822 (1998-01-01), Petrosino
patent: 5781559 (1998-07-01), Muris et al.
patent: 5995731 (1999-11-01), Crouch et al.
patent: 6321320 (2001-11-01), Fleischman et al.
patent: 6327681 (2001-12-01), Yamagishi et al.
patent: 6560740 (2003-05-01), Zuraski, Jr. et al.
patent: 6681359 (2004-01-01), Au et al.
patent: 6728910 (2004-04-01), Huang
patent: 6763490 (2004-07-01), Krech, Jr. et al.
patent: 6769081 (2004-07-01), Parulkar
“Design-for-Test Analysis of a Buffered SDRAM DIMM” by Jandhyala et al. This paper appears in: Records of the 1996 IEEE Memory Technology, International Workshop on Design and Testing, Publication.Date: 1996 On page(s): 110-116 ISSN: 1087-4852 ISBN: 0-8186-7466-0.

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