Memory module with a test device

Details Memory module with a test device Memory module with a test device

2008-01-01

2008-01-01

Kerveros, James C. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

10737776

ABSTRACT:
A memory module, which enables a module-internal, cross-chip electrical functional test of a plurality of integrated memory chips arranged on a printed circuit board of the memory module, includes a test device arranged separately from the memory chips on the printed circuit board. The test device relies on a clock signal provided by an external tester and generates the test signals required for carrying out the functional test and forwards the signals via control lines, address lines, data lines, and lines for the selection of individual memory chips to the latter. The partial integration of test functions into the test device enables a greater independence with respect to external electromagnetic interference influences without the space requirement of the memory module being increased overmuch.

REFERENCES:
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patent: 2006/0239055 (2006-10-01), Sonoda et al.
patent: WO 02/25957 (2002-03-01), None
Examination Report corresponding to DE 10260 184.4-55 (2 pages), Apr. 13, 2004.

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