Memory module and on-line build-in self-test method thereof...

Details Memory module and on-line build-in self-test method thereof... Memory module and on-line build-in self-test method thereof...

2011-03-15

2011-03-15

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S030000, C714S723000, C714S730000, C714S742000, C710S260000, C710S261000, C710S262000, C710S263000, C710S264000, C711S005000, C711S151000, C711S158000, C365S201000

Reexamination Certificate

active

07908530

ABSTRACT:
A memory module including a plurality of memory banks, a memory control unit, and a built-in self-test (BIST) control unit is provided. The memory banks store data. The memory control unit accesses the data in accordance with a system command. The BIST control unit generates a BIST command to the memory control unit when a BIST function is enabled in the memory module. While the system command accessing the data in a specific memory bank exists, the memory command control unit has the priority to execute the system command instead of the BIST command testing the specific memory bank. Memory reliability of a system including the memory module is enhanced without reducing the system effectiveness.

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