Memory module and method of testing the same

Details Memory module and method of testing the same Memory module and method of testing the same

2007-05-15

2007-05-15

Kerveros, James C (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

10831702

ABSTRACT:
A memory module, including a plurality of semiconductor memory devices for writing and reading m-bit parallel data; and a buffer for converting n-bit serial data into the m-bit parallel data to output to the plurality of semiconductor memory devices, converting the m-bit parallel data into the n-bit serial data to output to a first external portion during a normal operation, buffering 2n-bit parallel data to output to the plurality of semiconductor memory devices, and buffering the m-bit parallel data to output to a second external portion during a test operation.

REFERENCES:
patent: 6421291 (2002-07-01), Watanabe et al.

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