Memory module and memory component built-in self test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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C714S735000, C365S201000

Reexamination Certificate

active

06928593

ABSTRACT:
A memory component with built-in self test includes a memory array. An input/output interface is coupled to the memory array and has a loopback. A controller is provided to transmit memory array test data to the memory array to store the memory array test data, and to read the memory array test data from the memory array. A compare register is also provided to compare the memory array test data transmitted to the memory array with the memory array test data read from the memory array.

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