Static information storage and retrieval – Systems using particular element – Semiconductive
Reexamination Certificate
2011-03-29
2011-03-29
Le, Vu A (Department: 2824)
Static information storage and retrieval
Systems using particular element
Semiconductive
C365S189160, C365S185240
Reexamination Certificate
active
07916531
ABSTRACT:
In a first aspect, a first apparatus is provided. The first apparatus is a memory element that includes (1) one or more MOSFETs each including a dielectric material having a dielectric constant of about 3.9 to about 25; and (2) control logic coupled to at least one of the one or more MOSFETs. The control logic is adapted to (a) cause the memory element to operate in a first mode to store data; and (b) cause the memory element to operate in a second mode to change a threshold voltage of at least one of the one or more MOSFETs from an original threshold voltage to a changed threshold voltage such that the changed threshold voltage affects data stored by the memory element when operated in the first mode. Numerous other aspects are provided.
REFERENCES:
patent: 5166646 (1992-11-01), Avanic et al.
patent: 5220194 (1993-06-01), Golio et al.
patent: 6061267 (2000-05-01), Houston
patent: 6198652 (2001-03-01), Kawakubo et al.
patent: 6608775 (2003-08-01), Lu et al.
patent: 6828638 (2004-12-01), Keshavarzi et al.
patent: 7023056 (2006-04-01), Liaw
patent: 2002/0071305 (2002-06-01), Lu et al.
patent: 2003/0048655 (2003-03-01), El-Sharawy et al.
patent: 2008/0144252 (2008-06-01), Abadeer et al.
Rino Choi et al., “Effects of drain to gate stress on NMOSFET wtih polysilicon/HF-silicate gate stack”, 2004, International SEMATECH—presentation visuals booklet, pp. HIK2-1-HIK2-10.
H. Rusty Harris et al., “Recovery of NBTI degradation in HfSiON/Metal Gate Transistors”, 2004, International SEMATECH—presentaion visuals booklet, pp. HIK3-1-HIK2-10.
Jang H. (Johnny) Sim et al., “Hot carrier stress study in Hf-silicate NMOS transistors”, 2004, International SEMATECH—presentation visuals booklet, pp. HIK4-1-HIK4-8.
G Bersuker et al., “Mobility Evaluation in High-K Devices”, 2004, International SEMATCH—presentation visuals booklet, pp. HIK5-1-HIK5-6.
Abadeer Wagdi W.
Bonaccio Anthony R
Mandelman Jack A
Tonti William R.
Ventrone Sebastian T
International Business Machines - Corporation
Le Vu A
Truelson Roy W.
Yang Han
LandOfFree
Memory elements and methods of using the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Memory elements and methods of using the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory elements and methods of using the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2733459