Memory devices having programmable elements with accurate...

Details Memory devices having programmable elements with accurate... Memory devices having programmable elements with accurate...

2010-02-17

2011-10-25

Hoang, Huan (Department: 2827)

Static information storage and retrieval

Read/write circuit

Having fuse element

C365S230030, C365S063000

Reexamination Certificate

active

08045415

ABSTRACT:
Techniques are disclosed for reading operating parameters from programmable elements on memory devices to configure a memory system. More specifically, programmable elements, such as antifuses, located on a memory device are programmed during fabrication with measured operating parameters corresponding to the memory device. Operating parameters may include, for example, operating current values, operating voltages, or timing parameters. The memory device may be incorporated into a memory module that is incorporated into a system. Once the memory module is incorporated into a system, the programmable elements may be accessed such that the memory system can be configured to optimally operate in accordance with the operating parameters measured for each memory device in the system.

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