Induced nuclear reactions: processes – systems – and elements – Nuclear transmutation – By neutron bombardment
Reexamination Certificate
2006-02-28
2009-12-29
Le, Thong Q (Department: 2827)
Induced nuclear reactions: processes, systems, and elements
Nuclear transmutation
By neutron bombardment
C365S033000, C365S022000, C365S097000, C365S173000
Reexamination Certificate
active
07639771
ABSTRACT:
A memory device with a magnetic field generator and method of operating and manufacturing the same. In the device and method, a magnetic memory may includes a magnetic tunneling junction (MTJ) cell, a transistor, and a bit line, and a magnetic field generator external to the magnetic memory to generate a global magnetic field toward the magnetic memory in a parallel direction to the bit line.
REFERENCES:
patent: 6404671 (2002-06-01), Reohr et al.
patent: 6611454 (2003-08-01), Hidaka
patent: 6621731 (2003-09-01), Bessho et al.
patent: 7136298 (2006-11-01), Frey
patent: 7257018 (2007-08-01), Ho et al.
patent: 2002/0176277 (2002-11-01), Bessho et al.
patent: 2004/0037110 (2004-02-01), Ooishi
patent: 2004/0047177 (2004-03-01), Fukuzumi
patent: 2004/0160822 (2004-08-01), Ooishi
patent: 2004/0196693 (2004-10-01), Iwata
patent: 2005/0002229 (2005-01-01), Matsutera et al.
patent: 2005/0146967 (2005-07-01), Park et al.
patent: 2005/0242384 (2005-11-01), Iwata et al.
Hwang In-jun
Jeong Won-cheol
Kim Tae-wan
Harness & Dickey & Pierce P.L.C.
Le Thong Q
Samsung Electronics Co,. Ltd.
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