Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-05-30
2006-05-30
Booth, Richard A. (Department: 2812)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S261000
Reexamination Certificate
active
07053445
ABSTRACT:
A memory device may include a substrate, a dielectric layer formed on the substrate and a charge storage element formed on the dielectric layer. The memory device may also include an inter-gate dielectric formed on the charge storage element, a barrier layer formed on the inter-gate dielectric and a control gate formed on the barrier layer. The barrier layer prevents reaction between the control gate and the inter-gate dielectric.
REFERENCES:
patent: 6248628 (2001-06-01), Halliyal et al.
patent: 6596590 (2003-07-01), Miura et al.
patent: 2005/0194627 (2005-09-01), Nomoto et al.
Co-pending U.S. Appl. No. 11/135,492, filed May 24, 2005, entitled “Interface Layer Between Dual Polycrystalline Silicon Layers”, Mark Ramsbey et al., 20 pages.
Suh Youseok
Torii Satoshi
Xue Lei
Booth Richard A.
Spansion LLC
Spansion LLC
LandOfFree
Memory device with barrier layer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Memory device with barrier layer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory device with barrier layer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3541448