Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-06-28
2011-06-28
Soward, Ida M (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S316000, C257S318000, C257S320000, C257S321000, C257S322000, C257SE21422, C257SE29300
Reexamination Certificate
active
07968934
ABSTRACT:
An integrated memory device, an integrated memory chip and a method for fabricating an integrated memory device is disclosed. One embodiment provides at least one integrated memory device with a drain, a source, a floating gate, a selection gate and a control gate, wherein the conductivity between the drain and the source can be controlled independently via the control gate.
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Peters Christian
Strenz Robert
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Soward Ida M
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