Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-10-16
2007-10-16
Quach, T. N. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S379000, C257S536000, C257S539000, C257SE29300
Reexamination Certificate
active
11376423
ABSTRACT:
A memory device may include a plurality of resistance nodes. The resistance nodes may be connected serially in a NAND or AND structure, by a plurality of metal plugs. The metal plugs may have a lower resistance. A control device corresponding to each resistance node may control the resistance devices. Each control device may be connected to a bit line and a word line. The bit line may be connected to the metal plugs via a corresponding switch device.
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C. Rossel et al., “Electrical Current Distribution Across A Metal-Insulator-Metal Structure During Bistable Switching” Journal of Applied Physics. vol. 90, No. 6, pp. 2892-2898. Sep. 15, 2001.
Korean Office Action dated May 26, 2006 (with English translation).
Kim Won-joo
Park Yoon-dong
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