Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-12-29
2010-06-01
Phan, Trong (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S205000, C365S207000, C365S208000
Reexamination Certificate
active
07729184
ABSTRACT:
Provided is a memory device that can detect a mismatch in a bit line sense amp, wherein the memory device includes a sense amp drive unit for selectively supplying a pull-up drive voltage or a pull-down drive voltage to a bit line sense amp in response to a sensing test signal provided from outside.
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Do Chang-Ho
Im Jae-Hyuk
Blakely & Sokoloff, Taylor & Zafman
Hynix / Semiconductor Inc.
Phan Trong
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