Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2006-10-24
2006-10-24
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S189070, C365S225700
Reexamination Certificate
active
07126864
ABSTRACT:
Disclosed herein is a memory device capable of changing data output modes. According to the present invention, an address that is input to a circuit, which is designed in 8-bit output mode, is internally modified, to operate in 16-bit output mode, and a test operation is performed in 8-bit output mode. As such, two kinds of output mode circuits can be tested in one test equipment. Accordingly, test efficiency can be enhanced and costs can be saved.
REFERENCES:
patent: 5519657 (1996-05-01), Arimoto
patent: 6141282 (2000-10-01), Chin et al.
patent: 6246623 (2001-06-01), Ingalls
patent: 6909646 (2005-06-01), Hasegawa et al.
Hoang Huan
Hynix / Semiconductor Inc.
Townsend and Townsend / and Crew LLP
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