Static information storage and retrieval – Read/write circuit – Including signal comparison
Reexamination Certificate
2008-10-15
2011-11-22
Nguyen, Dang (Department: 2824)
Static information storage and retrieval
Read/write circuit
Including signal comparison
C365S191000, C365S185030
Reexamination Certificate
active
08064273
ABSTRACT:
A memory device is disclosed that includes multiple bit cells, whereby each bit cell is capable of being programmed to more than two states. A value stored at the memory device is determined by comparing the information stored at three or more of the bit cells. In an embodiment, the bit cell includes a silicon-on-insulator (SOI) metal oxide semiconductor field effect transistor (FET) device, and the information stored at the bit cell can be represented by a corresponding level of charge stored in the body of the device.
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Potok Ronald M.
Thayer Matthew L.
Globalfoundries Inc.
Nguyen Dang
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