Memory device and method of operating such a memory device

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator

Reexamination Certificate

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Details

C365S189011, C365S189110, C365S185180, C365S185250, C365S226000

Reexamination Certificate

active

07613053

ABSTRACT:
A memory device and method of operation are provided. The memory device comprises a plurality of memory cells arranged in at least one column, during a write operation a data value being written to an addressed memory cell within a selected column from said at least one column. A supply voltage line is associated with each column, the supply voltage line being connectable to a first voltage source to provide a supply voltage at a first voltage level to the associated column. Threshold circuitry is connected to a second voltage source having a second voltage level, the threshold circuitry having a threshold voltage. Control circuitry is used during the write operation to disconnect the supply voltage line for the selected column from the first voltage source, and to connect the threshold circuitry to the supply voltage line for the selected column. As a result, the supply voltage to the addressed memory cell transitions to an intermediate voltage level determined by the threshold voltage of the threshold circuitry, thereby de-stabilizing the addressed memory cell and assisting in the write operation. The technique of the present invention provides a particularly simple and power efficient technique for implementing a write assist mechanism.

REFERENCES:
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patent: 2005/0088881 (2005-04-01), Miki et al.
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Pilo Harold, et al., “An SRAM Design in 65-nm Technology Node Featuring Read and Write-Assist Circuits to Expand Operating Voltage”, IEEE Journal of Solid-State Circuits, vol. 42, No. 4, pp. 813-819, (Apr. 4, 2007).
Pilo, Harold et al., “An SRAM Design in 65nm and 45nm Technology Nodes Featuring Read and Write-Assist Circuits to Expand Operating Voltage”, 2006 Symposium on VLSI Circuits Digest of Technical Papers, 2 pages, (2006).
Ohbayashi, Shigeki et al., “A 65-nm SoC Embedded 6T-SRAM Designed for Manufacturability with Read and Write Operation Stabilizing Circuits”, IEEE Journal of Solid-State Circuits, vol. 42, No. 4, pp. 820-829, (Apr. 4, 2007).
Yabuuchi, Makoto, et al., “A 45nm Low-Standby-Power Embedded SRAM with Improved Immunity Against Process and Temperature Variations”, Digest of Technical Papers, ISSCC 2007/Session 18/SRAM/18.3, pp. 326-327 and 606, (2007).
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