Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-02-26
2010-11-02
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S188000, C702S189000, C702S190000
Reexamination Certificate
active
07826996
ABSTRACT:
A memory daughter card (MDC) is described, having a very high-speed serial interface and an on-card MDC test engine that allows one MDC to be directly connected to another MDC for testing purposes. In some embodiments, a control interface allows the test engine to be programmed and controlled by a test controller on a test fixture that allows simultaneous testing of a single MDC or one or more pairs of MDCs, one MDC in a pair (e.g., the “golden” MDC) testing the other MDC of that pair. Other methods are also described, wherein one MDC executes a series of reads and writes and other commands to another MDC to test at least some of the other card's functions, or wherein one port executes a series of test commands to another port on the same MDC to test at least some of the card's functions.
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Bethard Roger A.
Grossmeier Alan M.
Marquardt Kelly J.
Resnick David R.
Schwoerer Gerald A.
Cray Inc.
Feliciano Eliseo Ramos
Huynh Phuong
Lemaire Charles A.
Lemaire Patent Law Firm, P.L.L.C.
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