Memory core testing system

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371 20, 365201, 324 73AT, G06F 1122

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active

045190763

ABSTRACT:
A means for testing the threshold voltage changes in a programmable and erasable floating gate memory cell by accessing directly and exclusively the cells in the core, and the amplifiers that sense the operation of the cells, so as to measure the relative currents therein as an indication of threshold voltage parameters.

REFERENCES:
patent: 3712537 (1973-01-01), Carita
patent: 3795859 (1974-03-01), Benante et al.
patent: 3813032 (1974-05-01), King
patent: 3820077 (1974-06-01), Giebler et al.
patent: 4066880 (1978-01-01), Sailey
patent: 4243937 (1981-01-01), Multani et al.
patent: 4272833 (1981-06-01), Taylor
patent: 4298980 (1981-11-01), Hajdu et al.
patent: 4326290 (1982-04-01), Davis et al.
patent: 4393475 (1983-07-01), Kitagawa et al.
Das Gupta, IBM Technical Disclosure Bulletin, "Memory Array Having Independent Data Reading and Data Checking", vol. 15, No. 1, Jun. 1972, pp. 39-40.
Moyers et al., "Electrical Characterization of Complex Memories", Final Technical Report, RADC-TR-80-401, Part 2, Rome Air Development Center, Griffis AFB, NY, Jan. 1981.

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