Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1997-12-17
2000-10-10
Dutton, Brian
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
714718, H01L 2358
Patent
active
061304425
ABSTRACT:
An integrated circuit chip which has a volatile memory also has a non-volatile memory for storing the parameter of a volatile memory which was measured while the chip was part of a completed wafer.
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patent: 5895962 (1999-04-01), Zheng et al.
patent: 5907492 (1999-05-01), Akram et al.
Di Zenzo Maurizio
Savarese Giuseppe
Dutton Brian
Kempler William B.
Telecky Jr. Frederick J.
Texas Instruments Incorporated
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