Memory channel self test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Details

C714S724000

Reexamination Certificate

active

07321997

ABSTRACT:
A buffer logic within a memory module having the capability to carry out a test of another memory module to which it is coupled via a point-to-point bus through autonomously storing and transmitting a test pattern across that point-to-point bus to the other memory module, while further employing another buffer logic that is interposed between the two memory modules to pass on the test pattern, but intercept a signal received from the other memory module during the test and pass on an indication of the receipt of that signal to an analysis device to monitor the test.

REFERENCES:
patent: 5561672 (1996-10-01), Kaneko
patent: 5852617 (1998-12-01), Mote, Jr.
patent: 5875195 (1999-02-01), Dixon
patent: 6502161 (2002-12-01), Perego et al.
patent: 6771087 (2004-08-01), Oz et al.
patent: 2002/0056062 (2002-05-01), Hartmann
patent: 2002/0125879 (2002-09-01), Lee et al.
patent: 2003/0041086 (2003-02-01), Lankreijer

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