Memory cell with a perovskite structure varistor

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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C257S537000, C257S295000

Reexamination Certificate

active

06998698

ABSTRACT:
The present invention provides a memory cell having a variable resistor as a memory element, and also provides a memory device comprising the memory cells. The variable resistor is made of a thin-film material (for example, PCMO) or the like having a perovskite structure. So the memory cell can operate at a low voltage and can be highly integrated. The memory cell MC is formed of a combination of a current controlling device and a variable resistor. A field-effect transistor, diode or bipolar transistor is used as the current controlling device. The current controlling device is connected in series with the current path of the variable resistor so as to control a current flowing through the variable resistor.

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S.Q. Liu, N.J. Wu and A. Ignatiev (Nov. 7-Aug. 2001) “A New Concept for Non-Volatile Memory: The Electric-Pulse Induced Resistive Change Effect in Colossal Magnetoresistive Thin Films” IEEE Proceedings, Non-Volatile Memory Technology Symposium 2001, p. 18-24.
S.Q. Liu, N.J. Wu and A. Ignatiev (May 8, 2000)“Electric-pulse-induced reversible resistance change effect in magnetoresistive films” Applied Physics Letters vol. 76, No. 19, p. 2749-2751.
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Office Action [Summons to Attend Oral Proceedings Pursuant to Rule 71(1) EPC] mailed Jul. 27, 2005, for EP Patent Application No. 03254030.4, two pp.

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