Memory cell signal window testing apparatus

Details Memory cell signal window testing apparatus Memory cell signal window testing apparatus

2006-02-14

2006-02-14

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S116000, C702S119000, C702S120000

Reexamination Certificate

active

06999887

ABSTRACT:
A memory cell signal window testing apparatus101and method for testing the signal window of a memory are disclosed. First data is written to a memory cell during a write cycle. A low cell signal is read from the memory cell during a first read cycle. A comparison is made between the low signal and a low reference signal. The result of the comparison is stored in a first storage register. Second data is then written to the memory cell during a write cycle. A high cell signal is read from the memory cell during a second read cycle. A comparison is made between the high cell signal and a high reference signal. The result of the comparison is stored in a second storage register. The results in the first and second storage registers are compared and an output is provided indicating that the memory cell has failed the test if the comparison shows that both the low cell signal is higher than the low reference signal and the high cell signal is lower than the high reference signal.

REFERENCES:
patent: 6065092 (2000-05-01), Roy
patent: 6119251 (2000-09-01), Cloud et al.
patent: 6282135 (2001-08-01), Proebsting
patent: 6675272 (2004-01-01), Ware et al.
patent: 6920540 (2005-07-01), Hampel et al.
patent: 2004/0143710 (2004-07-01), Walmsley

Affiliated with

Also associated with

Rating

Memory cell signal window testing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory cell signal window testing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory cell signal window testing apparatus will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3636948