Static information storage and retrieval – Floating gate
Reexamination Certificate
2011-01-25
2011-01-25
Toledo, Fernando L (Department: 2895)
Static information storage and retrieval
Floating gate
C365S149000, C365S182000, C365S185130, C365S185170, C365S185180, C365S230060, C438S158000, C438S257000, C711S101000, C257S059000, C257S306000, C257S309000, C257S311000, C257S314000, C257S315000, C257S321000, C257S405000, C257S410000, C257S905000, C257S908000, C257SE29162
Reexamination Certificate
active
07876610
ABSTRACT:
A plurality of first transistors formed on a substrate share a gate electrode. Isolation regions isolate the plurality of first transistors from one another. In the region where the plurality of first transistors, an impurity region is formed in such a manner that it includes the source and drain regions of the plurality of first transistors and that the depth of the impurity region is greater than the depth of the source and drain regions. The impurity region sets the threshold voltage of the first transistors.
REFERENCES:
patent: 5946230 (1999-08-01), Shimizu et al.
patent: 2005/0265109 (2005-12-01), Goda et al.
patent: 2002-324400 (2002-11-01), None
U.S. Appl. No. 12/338,417, filed Dec. 18, 2008, Kato, et al.
Gomikawa Kenji
Noguchi Mitsuhiro
Dulka John P
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Toledo Fernando L
LandOfFree
Memory cell array with specific placement of field stoppers does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Memory cell array with specific placement of field stoppers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory cell array with specific placement of field stoppers will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2677104