Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-09-25
2007-09-25
Purvis, Sue A. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000, C438S238000, C438S242000
Reexamination Certificate
active
11152793
ABSTRACT:
A memory cell array includes memory cells with storage capacitor and an access transistor. The access transistors are formed in active areas. The memory cell array further includes bit lines oriented in a first direction and word lines oriented in a second direction. The active areas extend in the second direction. The bottom side of each gate electrode of the transistors is disposed beneath the bottom side of each word line. In addition, the word lines are disposed above the bit lines.
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Kim, et al., “The Breakthrough in data retention time of DRAM using Recess-Channel-Array Transistor (RCAT) for 88 nm feature size and beyond,” 2003 Symposium on VLSI Technology Dig. of Tech. Papers.
Heineck Lars
Holz Juergen
Jakubowski Frank
Popp Martin
Edell Shapiro & Finnan LLC
Erdem Fazli
Infineon - Technologies AG
Purvis Sue A.
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