Static information storage and retrieval – Systems using particular element – Semiconductive
Reexamination Certificate
2007-03-28
2009-06-16
Nguyen, Tuan T (Department: 2824)
Static information storage and retrieval
Systems using particular element
Semiconductive
C365S148000, C365S149000
Reexamination Certificate
active
07548454
ABSTRACT:
Methods and apparatus for measuring the bit state of a particular element in an array of passive nonlinear elements that are insensitive to loading effects from external connections to the array. In one embodiment, a switching element is used to electrically isolate the elements in the array from the external load.
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Contour Semiconductor, Inc.
Goodwin & Procter LLP
Nguyen Hien N
Nguyen Tuan T
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