Memory array repair where repair logic cannot operate at...

Details Memory array repair where repair logic cannot operate at... Memory array repair where repair logic cannot operate at...

2006-01-13

2008-07-01

Louis-Jacques, Jacques (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S710000, C714S711000

Reexamination Certificate

active

07395465

ABSTRACT:
Memory array repair where the repair logic cannot operate at the same operating condition as the memory array is presented. In one embodiment, a test is run with the memory array configured in a first operating condition that repair logic for the memory array cannot achieve, and test data is accumulated from the test in the memory array. The memory array is then read with the memory array configured in a second operating condition that the repair logic can achieve using the test data from the test at the first operating condition. As a result, repairs can be achieved even though the repair logic is incapable of operating at the same condition as the memory array. A method, test unit and integrated circuit implementing the testing are presented.

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