Memory access and data control

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C711S133000

Reexamination Certificate

active

06675319

ABSTRACT:

BACKGROUND OF THE INVENTION
This invention relates to semiconductor memory devices, memory chips, memory modules, and the handling of defective memory components.
Due to the yield limitation of semiconductor fabrication process, a semiconductor memory wafer usually contains defective memory devices. As the cell density of the semiconductor device increases, it is becoming harder to achieve high production yield.
During the device fabrication process, certain repairing process may be used to replace defective rows or columns in the memory cell array. However, there is a limit as to the capability of such repairing process. Certain memory devices remain defective at the semiconductor die level after the fabrication process.
To repair the memory devices above the die level is a complex issue regarding feasibility, efficiency, and performance.
BRIEF SUMMARY OF THE INVENTION
This invention proposes a method and apparatus to efficiently utilize partially defective memory devices to construct usable memory chip or module packages that meet the specification of a functional package.
This invention provides a method that maximizes the usage of non-defective memory data bits in the partially defective memory devices.
The present invention provides a method that simplifies the production and process of memory chips or modules.
This invention further provides a method to minimize or eliminate the initialization of the chips or modules.


REFERENCES:
patent: 5255227 (1993-10-01), Haeffele
patent: 5353253 (1994-10-01), Nakajima
patent: 5548554 (1996-08-01), Pascucci et al.
patent: 5991902 (1999-11-01), Yoshida
patent: 6125421 (2000-09-01), Roy
patent: 6373757 (2002-04-01), Bishop
patent: 6567290 (2003-05-01), Alexanian

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Memory access and data control does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Memory access and data control, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Memory access and data control will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3250758

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.