Static information storage and retrieval – Systems using particular element – Ferroelectric
Reexamination Certificate
2008-04-29
2008-04-29
Phung, Anh (Department: 2824)
Static information storage and retrieval
Systems using particular element
Ferroelectric
C365S203000
Reexamination Certificate
active
11328223
ABSTRACT:
A memory capable of suppressing reduction of a reading voltage in data reading regardless of dispersion in a manufacturing process is provided. This memory comprises charge storage means, a first field-effect transistor and data determination means. The memory sets a voltage between a control terminal and a remaining first terminal of the first field-effect transistor to a threshold voltage for bringing the first field-effect transistor into an OFF-state in the vicinity of a boundary state between ON- and OFF-states through the threshold voltage of the first field-effect transistor.
REFERENCES:
patent: 6023438 (2000-02-01), Tanaka et al.
patent: 6434039 (2002-08-01), Braun et al.
patent: 6487103 (2002-11-01), Yamamoto et al.
patent: 6661697 (2003-12-01), Yamamoto et al.
patent: 6970371 (2005-11-01), Summerfelt et al.
patent: 2002-133857 (2002-05-01), None
Matsushita Shigeharu
Miyamoto Hideaki
Sakai Naofumi
Yamada Kouichi
McDermott Will & Emery LLP
Phung Anh
Sanyo Electric Co,. Ltd.
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