Measuring method for a semiconductor memory, and...

Details Measuring method for a semiconductor memory, and... Measuring method for a semiconductor memory, and...

2006-12-14

2009-06-02

Le, Thong Q (Department: 2827)

Static information storage and retrieval

Systems using particular element

Capacitors

C365S192000, C365S194000

Reexamination Certificate

active

07542327

ABSTRACT:
The invention relates to a semiconductor memory, and to a measuring method for a semiconductor memory. In one case, the method includes connecting a memory cell to a ring oscillator and measuring the frequency resulting for said ring oscillator.

REFERENCES:
patent: 6600680 (2003-07-01), Sell et al.
patent: 6774734 (2004-08-01), Christensen et al.
patent: 7066643 (2006-06-01), Lee et al.
patent: 2006/0126412 (2006-06-01), Maki
patent: 2006/0268632 (2006-11-01), Schnell et al.
patent: 2007/0086232 (2007-04-01), Joshi et al.
patent: 2007/0237012 (2007-10-01), Kuang et al.

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