Measuring chip-to-chip capacitance differentials by...

Details Measuring chip-to-chip capacitance differentials by... Measuring chip-to-chip capacitance differentials by...

2006-08-23

2008-09-16

Nguyen, Vincent Q (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S686000

Reexamination Certificate

active

07425836

ABSTRACT:
In a method for determining capacitance, a first time-varying signal is driven on a first terminal of a first capacitor and a second time-varying signal is driven on a first terminal of a second capacitor, where the first time-varying signal and the second time-varying signal have a pre-determined phase relationship with each other.These signals are received on second terminals of the first capacitor and the second capacitor and demodulated using a periodic signal to produce demodulated signals. This periodic signal has the same fundamental frequency as the first time-varying signal and the second time-varying signal. A DC component in the demodulated signals is then determined by filtering the demodulated signals, and the sign of the DC component is used to determine a relative capacitance of the first capacitor and the second capacitor.

REFERENCES:
patent: 6445195 (2002-09-01), Ward
patent: 2006/0022861 (2006-02-01), Kudoh et al.

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