4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Steven Stupp

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Measuring chip-to-chip capacitance differentials by...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Risk indices for enhanced throughput in computing systems

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2224471

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