Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2006-03-28
2006-03-28
Auduong, Gene N. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S210130, C365S233500
Reexamination Certificate
active
07020035
ABSTRACT:
Post-manufacture compensation for a sensing offset can be provided, at least in part, by selectively exposing one of a pair of cross-coupled transistors in a sense amplifier to a bias voltage selected to cause a compensating shift in a characteristic of the exposed transistor. Such exposure may be advantageously provided in situ by causing the sense amplifier to sense values purposefully skewed toward a predominate value selected to cause the compensating shift. In some realizations, purposefully skewed values (e.g., value and value_1) are introduced directly into the sense amplifier. In some realizations, an on-chip test block is employed to identify and characterize sensing mismatch.
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Eleyan Nadeem N.
Levy Howard L.
Su Jeffrey Y.
Auduong Gene N.
Sun Microsystems Inc.
Zagorin O'Brien Graham LLP
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