Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-01-25
2005-01-25
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S002000, C703S022000
Reexamination Certificate
active
06848088
ABSTRACT:
The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicated that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.
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Gauthron Christophe
Ho Chian-Min Richard
Levitt Jeremy Rutledge
Mulam Kalyana C.
Sathianathan Ramesh
Mentor Graphics Corporation
Silicon Valley Patent & Group LLP
Thompson A. M.
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