Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern
Reexamination Certificate
2007-01-24
2010-12-07
Brunsman, David M (Department: 1793)
Chemistry of inorganic compounds
Zeolite
Structure defined x-ray diffraction pattern
C423S706000, C423S702000, C208S046000, C208S111010, C208S135000
Reexamination Certificate
active
07846418
ABSTRACT:
An MCM-22 family molecular sieve having an X-ray diffraction pattern of the as-synthesized MCM-22 family molecular sieve including d-spacing maxima at 12.4±0.25, 3.57±0.07 and 3.42±0.07 Angstroms and at least one peak between 26.6° and 29° (2θ). The peak between 26.6° to 29° (2θ) has a two theta (2θ) of about 26.9°. A method of manufacturing an MCM-22 family molecular sieve, said method comprising the steps of (a) combining at least one silicon source, at least one source of alkali metal hydroxide, at least one directing-agent (R), water, and optionally one aluminum source, to form a mixture having the following mole composition:Si:Al2=10 to infinityH2O:Si=1 to 20OH−:Si=0.001 to 2M+:Si=0.001 to 2R:Si=0.001 to 0.34wherein M is an alkali metal; (b) treating said mixture at crystallization conditions for less than 72 hr to form a treated mixture having said MCM-22 family molecular sieve, wherein said crystallization conditions comprises a temperature range from about 160° C. to about 250° C.; and (c) recovering said MCM-22 family molecular sieve.
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Kay Robert Ellis
Lai Wenyih Frank
Brunsman David M
ExxonMobil Chemical Patents Inc.
Feng Xiaobing
Tyus Darryl M.
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