Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1996-03-25
1997-05-27
Chilcot, Richard
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73770, G01B 716
Patent
active
056334664
ABSTRACT:
The object of the present invention is to provide a maximum value storage sensor when detecting the maximum strain by generating an invariable electrical resistance change correlative to the strain of the detection object in a conductive body having a plurality of conductive elements. The maximum value storage sensor of the present invention has; a conductive body having a circuit which gives correlative resistance changes corresponding to the sequential cutoff of a plurality of conductive elements each having a given electrical resistance arrayed in parallel; a cutting means for cutting the conductive elements of the conductive body; and a structure for allowing one of the conductive bodies and the cutting means to move relatively to each other. The sensor is attached to an object component member in a structure so as to generate relative movements between the conductive body and the cutting means which correspond to any strains exerted upon the object component member, and it detects maximum strains in the object component member by allowing the cutting means to sequentially cut off the conductive elements of the conductive body corresponding to an amount of the relative movement.
REFERENCES:
patent: 3779071 (1973-12-01), Thamas, Jr. et al.
patent: 4065962 (1978-01-01), Shoberg
patent: 5095756 (1992-03-01), Edwards
Ichikawa Masato
Kobayashi Yoh-ichi
Nakasone Hirokazu
Saitoh Reizi
Yanagida Hiroaki
Bednarek Michael D.
Chilcot Richard
Nagano Keiki Seisakusho, Ltd.
Noori Max H.
Yanagida Hiroaki
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