Material characterization system

Details Material characterization system Material characterization system

2006-01-31

2006-01-31

Nguyen, Kiet T. (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

C250S311000

Reexamination Certificate

active

06992286

ABSTRACT:
An electron beam device is provided with an electron beam diffraction image analysis section for calculation of the lattice distance from the diffraction image taken into by the TV camera for observation of the electron beam diffraction image, the EDX analysis section for acquiring a composition of the material, the data base for retrieval of material characterization, and the material characterization section having the data base retrieval function. The material characterization section characterizes the material by retrieving the retrieval data base, based upon the lattice distance data transferred from the electron beam diffraction image analysis section and the element data transferred from the EDX analysis sectio.

REFERENCES:
patent: 5557104 (1996-09-01), Field et al.
patent: 59-163550 (1984-09-01), None
patent: 01-209648 (1989-08-01), None
patent: WO 02/068944 (2002-09-01), None

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