Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2004-04-30
2008-10-07
Beausoliel, Jr., Robert W (Department: 2113)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S030000, C717S124000, C717S128000, C712S227000
Reexamination Certificate
active
07434108
ABSTRACT:
In current real-time debug systems, debug messages are transmitted through a limited bandwidth port (18) from an integrated circuit (10) to an external development system (25). As some integrated circuits (10) become even more densely packed with multiple bus masters (11, 12) and/or multiple busses (16) capable of generating messages, it is becoming more and more difficult for the limited bandwidth port (18) to sufficiently support the volume of debug messages that are to be transmitted from an integrated circuit (10) to an external development system (25). A plurality of masks (70, 80, 90, 100, 110, 120, 130, 140, 150) and masking circuitry (36) may be used to selectively mask portions (41-45, 51-55) of debug messages (40, 50) in order to significantly improve bandwidth.
REFERENCES:
patent: 4598364 (1986-07-01), Gum et al.
patent: 5513317 (1996-04-01), Borchardt et al.
patent: 5826058 (1998-10-01), Hartvlgsen et al.
patent: 6145122 (2000-11-01), Miller
patent: 6467083 (2002-10-01), Yamashita
patent: 6611924 (2003-08-01), Warmink et al.
patent: 6728949 (2004-04-01), Bryant et al.
patent: 6732311 (2004-05-01), Fischer et al.
patent: 6816989 (2004-11-01), Litt
patent: 6918065 (2005-07-01), Edwards et al.
patent: 7003699 (2006-02-01), Swaine et al.
patent: 7051237 (2006-05-01), Mayer
patent: 7149926 (2006-12-01), Ahmad et al.
patent: 2003/0126314 (2003-07-01), Litt
patent: WO 03/034225 (2003-04-01), None
Collins Richard G.
Moyer William C.
Beausoliel, Jr. Robert W
Chiu Joanna G.
Freescale Semiconductor Inc.
Guyton Philip
Hill Susan C.
LandOfFree
Masking within a data processing system having applicability... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Masking within a data processing system having applicability..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Masking within a data processing system having applicability... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3994756